root@velocity:~# smartctl -a /dev/sdb
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.10.17-200.fc25.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Ultrastar 7K4000
Device Model: Hitachi HUS724030ALE641
Serial Number: P8GBAW7P
LU WWN Device Id: 5 000cca 22cc528eb
Firmware Version: MJ8OA5F0
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Jun 5 22:12:43 2018 MDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 24) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 80
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 413
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 24
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 119 119 020 Pre-fail Offline - 35
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 23153
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 24
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 134
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 134
194 Temperature_Celsius 0x0002 230 230 000 Old_age Always - 26 (Min/Max 22/51)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 19057 hours (794 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 e8 70 b2 a7 0d Error: UNC 232 sectors at LBA = 0x0da7b270 = 229094000
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 58 b2 a7 40 00 2d+14:46:45.729 READ DMA EXT
25 00 78 08 a7 36 40 00 2d+14:46:45.719 READ DMA EXT
25 00 88 80 9e 7d 40 00 2d+14:46:45.719 READ DMA EXT
25 00 88 18 9c 7d 40 00 2d+14:46:45.719 READ DMA EXT
25 00 f8 10 af 57 40 00 2d+14:46:45.620 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short captive Completed without error 00% 23153 -
# 2 Vendor (0xb0) Completed without error 00% 22992 -
# 3 Vendor (0x71) Completed without error 00% 22992 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.